Fault detection in CMOS circuits by consumption measurement

Abstract

Some testing problems in CMOS circuits are presented, including stuck-open and stuck-on faults, bridging faults, and excessive leakage in dynamic CMOS circuits. It is shown that the current consumption of a faulty CMOS circuit is several orders of magnitude greater than that of the fault-free circuit: hence, consumption measurement may be a suitable way of testing. Test by consumption measurement provides improved controllability and observability of some faults in comparison with the logic test.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>