Publication | Closed Access
Characterization of ALCVD-Al2O3 and ZrO2 layer using X-ray photoelectron spectroscopy
249
Citations
9
References
2002
Year
Materials ScienceMaterials EngineeringAluminium NitrideEngineeringOxide ElectronicsSurface ScienceApplied PhysicsZro2 LayerVacuum DeviceChemical Vapor Deposition
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