Concepedia

Multireflection grazing incidence diffraction used for stress measurements in surface layers

A. Baczmański, Mirosław Wróbel, W. Seiler, C. Braham, Jörn Donges, Maciek Sniechowski, K. Wierzbanowski

Thin Solid Films · 2012 · 29 citations · 9 references

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References

9

Elements of X-ray Diffraction

E. D. T. Atkins · Physics Bulletin · 1978 · 7.1K citations

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Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

U. Welzel, J. Ligot, P. Lamparter et al. · Journal of Applied Crystallography · 2005 · 593 citations · Full text

, , +17

New approach to stress analysis based on grazing-incidence X-ray diffraction

S. J. Skrzypek, A. Baczmański, W. Ratuszek et al. · Journal of Applied Crystallography · 2001 · 94 citations

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A method for the non-destructive analysis of gradients of mechanical stresses by X-ray diffraction measurements at fixed penetration/information depths

U. Welzel, E. J. Mittemeijer · Journal of Applied Crystallography · 2006 · 89 citations

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Formalism for the evaluation of strongly non-linear surface stress fields by X-ray diffraction performed in the scattering vector mode

Ch. Genzel · physica status solidi (a) · 1994 · 83 citations

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