Ch. Genzel - Concepedia

Author

Ch. Genzel

Helmholtz-Zentrum Berlin für Materialien und Energie

Also Known As

C. Genzel, C. H. Genzel, CH. GENZEL, CH. Genzel, Ch Genzel, Ch. Genzel, Genzel, Ch.

Publications

1.9K

Citations

H-Index

Concepts

All Affiliations

Helmholtz-Zentrum Berlin für Materialien und Energie Fraunhofer Institute for Telecommunications, Heinrich Hertz Institute Technische Universität Berlin Clausthal University of Technology Max-Planck-Institut für Nachhaltige Materialien

About

Ch. Genzel is an author at Helmholtz-Zentrum Berlin für Materialien und Energie specializing in engineering, materials science, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	23	40	1.6K
2	Applied Physics	20	27	1.1K
3	Health Sciences	4	4	125
4	Chemistry	4	4	153
5	Natural Sciences	2	2	102

Ch. Genzel

Publications

1.7K

Citations

H-Index

Page 1

	Year	Citations
The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis Ch. Genzel, Ingwer A. Denks, Jens Gibmeier, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Materials ScienceEngineeringEnergy-dispersive Diffraction AnalysisSynchrotron Radiation ResearchApplied Physics	2007	206
Investigation of laser shock peening effects on residual stress state and fatigue performance of titanium alloys Emad Maawad, Yuji Sano, Lothar Wagner, Materials Science and Engineering A Materials ScienceEngineeringLow-cycle FatigueMechanical EngineeringStressstrain Analysis	2011	201
Investigation on the surface and near-surface characteristics of Ti–2.5Cu after various mechanical surface treatments Emad Maawad, H.‐G. Brokmeier, Lothar Wagner, Surface and Coatings Technology Materials ScienceEngineeringCorrosionMechanical EngineeringSurface Science	2011	84
Crystalline and chemical quality of CdTe and Cd1-xZnxTe grown by the Bridgman method in low temperature gradients Manfred Mühlberg, P. Rudolph, Ch. Genzel, Journal of Crystal Growth Materials ScienceInorganic ChemistryIi-vi SemiconductorEngineeringCrystal Material	1990	84
Formalism for the evaluation of strongly non-linear surface stress fields by X-ray diffraction performed in the scattering vector mode Ch. Genzel physica status solidi (a) X-ray SpectroscopyEngineeringScattering Vector ModeElectron DiffractionResidual Stress	1994	83
Application of energy-dispersive diffraction to the analysis of multiaxial residual stress fields in the intermediate zone between surface and volume Ch. Genzel, Carsten Stock, W. Reimers Materials Science and Engineering A Stress WaveEngineeringPhysicsIntermediate ZoneMechanics	2003	75
A new diffractometer for materials science and imaging at HASYLAB beamline G3 Thomas Wroblewski, O. Clauß, H.‐A. Crostack, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Materials ScienceNew DiffractometerEngineeringPhysicsMicroscopy	1999	63
Residual stress depth profiling in complex hard coating systems by X-ray diffraction M. Klaus, Ch. Genzel, H. Holzschuh Thin Solid Films Materials ScienceTribological CoatingEngineeringX-ray DiffractionApplied Physics	2008	58
X-ray residual stress analysis in thin films under grazing incidence – basic aspects and applications Ch. Genzel Materials Science and Technology Materials ScienceX-ray SpectroscopyEngineeringCrystalline DefectsMechanical Engineering	2005	58
X-Ray Stress Gradient Analysis in Thin Layers — Problems and Attempts at Their Solution Ch. Genzel physica status solidi (a) EngineeringResidual StressMechanics Of MaterialsX-ray ImagingNumerical Simulation	1997	51

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