A highly integrated 65-nm SoC process with enhanced power/performance of digital and analog circuits

Lawrence T. Clark, Daniel Zhao, Teymur Bakhishev, Hong Jo Ahn, Edward Boling, Michael Duane, K. Fujita, P. E. Gregory, Thomas Hoffmann, M. Hori,

2012 · 22 citations · 0 references

Concepts

Abstract

65nm Deeply Depleted Channel (DDC <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">TM</sup> ) transistors have been fabricated with a halo-free, un-doped epitaxial channel and enable reduced threshold voltage (V <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">T</inf> ) variation, lower supply voltage (V <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">CC</inf> ), enhanced body effect and I <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EFF</inf> . Digital circuits made using this technology show benefits ranging from 47% power reduction to 38% frequency increase. Analog circuits exhibit 4x greater amplifier gain despite lower V <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">DD</inf> , and current mirror mismatch (both global and local) shows 40% and 30% reduction for NMOS and PMOS, respectively.