Concepedia

Refractive indices of InAlAs and InGaAs/InP from 250 to 1900 nm determined by spectroscopic ellipsometry

H.W. Dinges, H. Burkhard, R. Lösch, H. Nickel, W. Schlapp

Applied Surface Science · 1992 · 53 citations · 3 references

DOI

Concepts

References

3

Optical properties of In1−<i>x</i>Ga<i>x</i>P1−<i>y</i>As<i>y</i>, InP, GaAs, and GaP determined by ellipsometry

H. Burkhard, H.W. Dinges, E. Kuphal · Journal of Applied Physics · 1982 · 181 citations

, , +17

Refractive Index of InP

G. D. Pettit, W. J. Turner · Journal of Applied Physics · 1965 · 137 citations

, , +3

Non-destructive characterisation of (Ga,In,Al,As,P)-based ternary multilayer structures using spectroscopic ellipsometry

Christopher Pickering, N. S. Garawal, D. Lancefield et al. · Applied Surface Science · 1991 · 11 citations

, , +13