Christopher Pickering

Spectroscopic ellipsometry characterization of strained and relaxed Si1−<i>x</i>Ge<i>x</i> epitaxial layers

Christopher Pickering, R. T. Carline, David J. Robbins et al. · Journal of Applied Physics · 1993 · 78 citations

Materials Science, Materials Engineering, Epitaxial Growth +12

Characterization of oxide layers on GaAs substrates

D. A. Allwood, R. T. Carline, N. J. Mason et al. · Thin Solid Films · 2000 · 62 citations

Semiconductors, Electrical Engineering, Engineering +5

Infrared reflectivity studies of gax in1-x asy p1-y quaternary compounds

Christopher Pickering · Journal of Electronic Materials · 1981 · 46 citations

Materials Science, Rare Earth Mineral, Engineering +7

Spectroscopic ellipsometry of Si1−<i>x</i>Ge<i>x</i> epilayers of arbitrary composition 0≤<i>x</i>≤0.255

R. T. Carline, Christopher Pickering, David J. Robbins et al. · Applied Physics Letters · 1994 · 38 citations

Materials Science, Engineering, Dislocation Interaction +15

Dielectric functions and critical points of strained In<i>x</i>Ga1−<i>x</i>As on GaAs

Christopher Pickering, R. T. Carline, M. T. Emeny et al. · Applied Physics Letters · 1992 · 38 citations

Semiconductors, Materials Science, Electrical Engineering +13