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Degradation and breakdown in thin oxide layers: mechanisms, models and reliability prediction

Materials ScienceReliability EngineeringThin Oxide LayersEngineeringHardware ReliabilityApplied PhysicsTime-dependent Dielectric BreakdownCircuit ReliabilityReliability PredictionElectronic PackagingDevice ReliabilityPhysic Of FailureElectrical Insulation