Degradation and breakdown in thin oxide layers: mechanisms, models and reliability prediction

Electron emission in intense electric fields

Ralph Howard Fowler, L. W. Nordheim · Proceedings of the Royal Society of London Series A Containing Papers of a Mathematical and Physical Character · 1928 · 5.7K citations · Full text

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A reliable approach to charge-pumping measurements in MOS transistors

G. Groeseneken, H.E. Maes, N. Beltran et al. · IEEE Transactions on Electron Devices · 1984 · 1.4K citations

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Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon

D. J. DiMaria, E. Cartier, D. Arnold · Journal of Applied Physics · 1993 · 716 citations

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New insights in the relation between electron trap generation and the statistical properties of oxide breakdown

R. Degraeve, G. Groeseneken, R. Bellens et al. · IEEE Transactions on Electron Devices · 1998 · 644 citations

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Trap creation in silicon dioxide produced by hot electrons

D. J. DiMaria, J. Stasiak · Journal of Applied Physics · 1989 · 615 citations

Natural Sciences, Materials Science, Physics +17