Scaling, optimization and design considerations of electrostatic discharge protection circuits in CMOS technology

Design of ion-implanted MOSFET's with very small physical dimensions

R.H. Dennard, F.H. Gaensslen, Hwa-Nien Yu et al. · IEEE Journal of Solid-State Circuits · 1974 · 3.4K citations

Engineering, Vlsi Design, Integrated Circuits +16

Continuum Electromechanics

T J Lewis · Physics Bulletin · 1982 · 649 citations

Nonlinear Elasticity, Engineering, Physics +14

Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse Voltages

Donald C. Wunsch, Robert Bell · IEEE Transactions on Nuclear Science · 1968 · 402 citations

Device Modeling, Electrical Engineering, Engineering +15

Semiconductor Power Devices

P. Bowler · Electronics and Power · 1978 · 233 citations

Semiconductor Devices, Electrical Engineering, Engineering +6

Pulse Power Failure Modes in Semiconductors

Dante M. Tasca · IEEE Transactions on Nuclear Science · 1970 · 170 citations

Electrical Engineering, Permanent Damage Levels, Engineering +14