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InAs/InGaAs quantum dot structures on GaAs substrates emitting at 1.3 μm
377
Citations
10
References
1999
Year
Optical MaterialsEngineeringLateral SizeOptoelectronic DevicesIngaas QuantumQuantum EngineeringSemiconductor NanostructuresSemiconductorsPhotodetectorsQuantum DotsMolecular Beam EpitaxyCompound SemiconductorNanophotonicsQuantum ScienceElectrical EngineeringPhotoluminescencePhysicsQuantum DeviceOptoelectronic MaterialsApplied PhysicsOptoelectronics
InAs self-organized quantum dots inserted in InGaAs quantum well have been grown on GaAs substrates by molecular beam epitaxy. The lateral size of the InAs islands has been found to be approximately 1.5 times larger as compared to the InAs/GaAs case, whereas the island heights and surface densities were close in both cases. The quantum dot emission wavelength can be controllably changed from 1.1 to 1.3 μm by varying the composition of the InGaAs quantum well matrix. Photoluminescence at 1.33 μm from vertical optical microcavities containing the InAs/InGaAs quantum dot array was demonstrated.
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