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EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice ModelingDevice ScalingField-effect TransistorsIntegrated Circuit DesignIntegrated Circuit DevicesSemiconductor HeterostructuresCarrier Drift VelocityCircuit Integration
21
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Point defects and dopant diffusion in silicon
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Shallow acceptor complexes in p-type ZnO
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Natural Sciences, Materials Engineering, Materials Science +16