Oxide and interface degradation and breakdown under medium and high field injection conditions: A correlation study - Concepedia

Concepedia

Publication | Closed Access

Oxide and interface degradation and breakdown under medium and high field injection conditions: A correlation study

42

Citations

4

References

1995

Year

R. Degraeve, G. Groeseneken, Ingrid De Wolf, H.E. Maes

Microelectronic Engineering

Interface DegradationEngineeringCorrosionBias Temperature InstabilityApplied PhysicsTime-dependent Dielectric BreakdownCorrelation StudyElectronic PackagingDevice ReliabilityMicroelectronicsPhysic Of FailureElectrical Insulation

References

	Year	Citations

Page 1