Analysis of temperature dependent measurements on Pd/ZnO Schottky barrier diodes and the determination of the Richardson constant

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Electron transport at metal-semiconductor interfaces: General theory

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On the difference in apparent barrier height as obtained from capacitance-voltage and current-voltage-temperature measurements on Al/p-InP Schottky barriers

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Temperature dependent barrier characteristics of CrNiCo alloy Schottky contacts on <i>n</i>-type molecular-beam epitaxy GaAs

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Barrier height inhomogeneities of epitaxial CoSi2 Schottky contacts on n-Si (100) and (111)

Shiyang Zhu, R.L. Van Meirhaeghe, Christophe Detavernier et al. · Solid-State Electronics · 2000 · 240 citations

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