Publication | Closed Access
Continuous-wave and ultrafast coherent reflectivity studies of excitons in bulk GaN
22
Citations
37
References
2008
Year
Wide-bandgap SemiconductorPhotonicsEngineeringPhysicsOptical PropertiesSpectroscopyNatural SciencesApplied PhysicsAluminum Gallium NitrideGan Power DeviceExcitonic PropertiesBulk GanCategoryiii-v SemiconductorCoherent Impulse ResponseOptoelectronicsExcitonic Parameters
We report an extensive study of the excitonic properties of freestanding and heteroepitaxial GaN samples using continuous-wave reflectivity and time-resolved autocorrelation measurements. The coherent impulse response of free excitons is recorded by using an interferometric correlation technique. Excitonic parameters of GaN are deduced from the combined analysis of both experiments. Oscillator strengths and transition energies are studied as a function of the residual biaxial strain of the sample and temperature-dependent measurements are used to determine the parameters of the exciton-phonon interaction in GaN.
| Year | Citations | |
|---|---|---|
Page 1
Page 1