Applied Physics Letters · 1988 · 58 citations · 6 references
Materials ScienceIon ImplantationEngineeringTunneling MicroscopyElectron MicroscopyMicroscopyNanotechnologyStm ImageSurface ScienceApplied PhysicsScanning Probe MicroscopySurface AnalysisIon-bombarded PbsMicroanalysisStacking FaultIon EmissionSingle Crystalline PbsCrystallography
Freshly cleaved (001) surfaces of single crystalline PbS were bombarded by 8 keV Kr+ ions at a dose of 3×1012 cm−2. Atomically resolved scanning tunneling microscopy (STM) images were taken showing damaged areas due to individual ion impacts. Analysis of a STM image shows a shallow impact crater, a stacking fault, displacement of Pb2+ and S2− ions from their regular surface sites, and migration of interstitials to the surface.
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Defect-cluster formation in high-energy-density cascades in gold
W. Jäger, K. L. Merkle · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1988 · 45 citations
Materials Science, Ion Implantation, Defect-cluster Formation +14