IEEE Transactions on Nuclear Science · 1985 · 14 citations · 0 references
Hardware SecuritySingle Event UpsetEngineeringDiscrete Event SystemComputer EngineeringFormal MethodsSystems EngineeringBuilt-in Self-testSeu TestingComputer ScienceDiscrete MathematicsMicroelectronicsSequential CmlTerminal Latch Upset
SEU testing of both combinatorial and sequential CML of identical technologies with Cf252 and Am241 heavy ion sources revealed agreement in the numbers of device disturbances in both categories of logic. The data confirms that terminal latch upset is primarily due to flip-flop toggling rather than by data path combinatorial logic disturbances.