Current Applied Physics · 2005 · 37 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationThin FilmsElectronic Material CharacterizationSemiconductor SurfacesThin Film Electrical PropertiesThin Film Surface MorphologyThin-film DepositionThin-film MaterialsAluminum NitrideMetal Thin FilmsNitride Thin FilmsNitrides Thin FilmsTemperature Effects On DepositionThin-film Growth Mechanisms
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R. Naik, R. Reif, J.J. Lutsky et al. · Journal of The Electrochemical Society · 1999 · 67 citations
Natural Sciences, Materials Engineering, Materials Science +17
Cinzia Caliendo, P. Imperatori · Journal of Applied Physics · 2004 · 50 citations
Natural Sciences, Materials Engineering, Materials Science +17