M. Clément

VEPFIT applied to depth profiling problems

A. van Veen, H. Schut, M. Clément et al. · Applied Surface Science · 1995 · 308 citations

Machine Vision, Image Analysis, Engineering +8

The beam and detector for the NA48 neutral kaon CP violation experiment at CERN

Viviana Fanti, A. Lai, D. Marras et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2007 · 191 citations · Full text

Engineering, Physics, Natural Sciences +6

Piezoelectric properties and residual stress of sputtered AlN thin films for MEMS applications

E. Iborra, J. Olivares, M. Clément et al. · Sensors and Actuators A Physical · 2004 · 113 citations

Materials Science, Aluminium Nitride, Engineering +10

Analysis of positron beam data by the combined use of the shape- and wing-parameters

M. Clément, Johan Nijs, P. Balk et al. · Journal of Applied Physics · 1996 · 110 citations

Beam Stability, Engineering, Different Positron +13

Multiphoton above-threshold ionisation of xenon at 0.53 and 1.06 m

F. Fabre, G. Petite, Pierre Agostini et al. · Journal of Physics B Atomic and Molecular Physics · 1982 · 103 citations

Photonics, Ionisation Order, X-ray Spectroscopy +15