Publication | Closed Access
Piezoelectric properties and residual stress of sputtered AlN thin films for MEMS applications
113
Citations
19
References
2004
Year
Materials ScienceAluminium NitrideEngineeringMicrofabricationApplied PhysicsMems ApplicationsPiezoelectric PropertiesResidual StressPiezoelectric MaterialPiezoelectricityThin FilmsMicroelectronicsThin Film Processing
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