Applied Physics Letters · 2007 · 151 citations · 18 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsMetal Oxide NanomaterialsMetal-semiconductor ContactsOxide SemiconductorsSemiconductor Crystal GrowthSemiconductor Device MaterialsSemiconductor SurfacesBarrier HeightsN-type Oxide SemiconductorsRectifying ContactsSchottky Barrier CharacteristicsSchottky Barrier ContactsSchottky ContactsSeries ResistanceZinc Oxides
A method of fabricating highly rectifying Schottky contacts on n-type ZnO using silver oxide has been developed and used to compare diode performance on hydrothermal and melt grown, bulk, single crystals. Silver oxide diodes on hydrothermal ZnO have lower ideality factors, lower reverse current voltage dependence, higher series resistance, and larger surface-polarity related differences in barrier height, compared to those on melt ZnO. These effects are explained by the large difference in resistivity between hydrothermal and melt ZnO. Barrier heights of 1.20eV were achieved on the Zn-polar face of hydrothermal ZnO which are the highest reported for n-type ZnO.
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ZnO Schottky ultraviolet photodetectors
S. Liang, H. Sheng, Y. Liu et al. · Journal of Crystal Growth · 2001 · 906 citations