Applied Physics Letters · 2005 · 35 citations · 11 references
Natural SciencesChemistryMaterials ScienceAnalytical ChemistrySurface ChemistryThin FilmsOrganic Electronic MaterialsSurface AdsorptionSurface PhysicsThin Film Surface MorphologyThin-film DepositionThin-film MaterialsFilm-substrate InteractionMolecular ElectronicsOrganic ElectronicsOrganic Thin FilmsRadiotracer AnalysisRadiotracer QuantificationThin Film Surface CharacterizationThin-film Morphology
The metallization of organic thin films is a crucial point in the development of molecular electronics. However, there is no method established yet to detect trace amounts of metal atoms in those thin films. Radiotracer measurements can quantify even very small amounts of material penetrating into the bulk, in our case less than 0.01% of a monolayer. Here, the application of this technique on two different well-characterized organic thin film systems (diindenoperylene and pentacene) is demonstrated. The results show that Ag is mainly adsorbed on the surface, but indicate that already at moderate deposition temperatures Ag can penetrate into the organic thin films and agglomerate at the film/substrate interface.
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High structural order in thin films of the organic semiconductor diindenoperylene
A. C. Dürr, Frank Schreiber, M. Münch et al. · Applied Physics Letters · 2002 · 141 citations