Publication | Closed Access
A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF
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References
1999
Year
Materials ScienceSurface StructureEngineeringSynchrotron Radiation ResearchElectron-beam LithographyMicroscopySurface ScienceApplied PhysicsSynchrotron RadiationsInstrumentationSynchrotron RadiationNew Uhv DiffractometerSynchrotron Radiation Source
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