Japanese Journal of Applied Physics · 1988 · 19 citations · 7 references
Optical MaterialsEngineeringOptoelectronic DevicesThin Film Process TechnologySilicon On InsulatorSemiconductorsOptical DegradationOptical PropertiesSaturation EffectEpitaxial GrowthThin Film ProcessingMaterials ScienceCrystalline DefectsOptoelectronic MaterialsSemiconductor MaterialSemiconductor Device FabricationApplied PhysicsThin FilmsAmorphous SolidOptoelectronicsAmorphous Silicon Films
The saturation effect of the optical degradation in hydrogenated amorphous silicon films (a-Si:H) deposited at various temperatures T s has been studied by means of photoconductivity measurements. It was confirmed that the saturation is mainly related to the simultaneous annealing at a higher light-soaking temperature T 1 (≧20°C) as well as the depletion of the weak Si-Si bonds at lower T 1 (≦0°C). The weak bond density (10 16 ∼10 18 /cm 3 ) estimated from the low-temperature saturation effect decreases with increasing T s corresponding to the growth of Si clusters.
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Kinetics of the metastable optically induced ESR in<i>a</i>-Si:H
Charles Lee, W. D. Ohlsen, P. C. Taylor et al. · Physical review. B, Condensed matter · 1985 · 51 citations