Applied Surface Science · 1999 · 34 citations · 7 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSolid State PhysicsSurface ScienceScanning Probe MicroscopySemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesSilicon MaterialsSurface PhysicsScanning Tunneling SpectroscopySilicon InterfacesSurface States
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Random and ordered defects on ion-bombarded Si(100)-(2×1) surfaces
H. Feil, Harold J. W. Zandvliet, Meng-Hsiu Tsai et al. · Physical Review Letters · 1992 · 96 citations · Full text