Statistics
Publications
14
Citations
788
H-Index
12
Active since
1982
H. Feil is an author at Philips (Netherlands) specializing in engineering, physics, and applied physics.
Publications per year
1982–2006
14
14
Random and ordered defects on ion-bombarded Si(100)-(2×1) surfaces
H. Feil, Harold J. W. Zandvliet, Meng-Hsiu Tsai et al. · Physical Review Letters · 1992 · 96 citations · Full text
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