A new generation-recombination model for device simulation including the Poole-Frenkel effect and phonon-assisted tunnelling

On Pre-Breakdown Phenomena in Insulators and Electronic Semi-Conductors

J. Frenkel · Physical Review · 1938 · 2K citations

Natural Sciences, Materials Science, Physics +14

Physics of semiconductors

Choice Reviews Online · 1995 · 1.7K citations

Theory of Tunneling

E. O. Kane · Journal of Applied Physics · 1961 · 1K citations

Natural Sciences, Electrical Engineering, Physics +13

A new recombination model for device simulation including tunneling

G.A.M. Hurkx, D.B.M. Klaassen, M.P.G. Knuvers · IEEE Transactions on Electron Devices · 1992 · 914 citations

Engineering, Electrical Engineering, Microelectronics +16

Electric field effect on the thermal emission of traps in semiconductor junctions

G. Vincent, A. Chantre, D. Bois · Journal of Applied Physics · 1979 · 523 citations

Engineering, Electrical Engineering, Materials Science +13