Acta Materialia · 2011 · 31 citations · 28 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistrySurface ScienceThin FilmsAluminum OxidesCoatingsThin-film DepositionThin-film MaterialsAlumina Thin FilmsGamma Aluminum OxideMagnetron SputteringSputter DepositionSputtering
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<i>R</i> factors in Rietveld analysis: How good is good enough?
Brian H. Toby · Powder Diffraction · 2006 · 1.4K citations · Full text
High-resolution depth profiling in ultrathin Al2O3 films on Si
E. P. Gusev, M. Copel, E. Cartier et al. · Applied Physics Letters · 2000 · 412 citations
Electronic and crystallographic structure of γ-alumina thin films
B. Ealet, M. H. El-yakhloufi, E. Gillet et al. · Thin Solid Films · 1994 · 237 citations