Accuracy evaluation of the point diffraction interferometer for extreme ultraviolet lithography aspheric mirror

Abstract

We evaluated the accuracy of the point diffraction interferometer, which has been completed at the Atsugi Research Center’s Association of Super-Advanced Electronics Technologies for the precise measurement of extreme ultraviolet lithography optics. To evaluate the absolute accuracy, more precision is required. A pinhole with 0.5 μm diameter was used to generate a near completely spherical reference wave front, and helium gas filled the inside of the chamber to suppress air turbulence. With this apparatus, precision of 0.04 nm root-mean-square (rms) was achieved. Absolute accuracy was evaluated from the measurement of mirror rotation and displacement and an absolute accuracy of 0.17 nm rms was obtained for a spherical mirror with numerical aperture of 0.145. Absolute accuracy was improved to 0.11 nm rms by limiting the numerical aperture to 0.08.