Thin Solid Films · 1999 · 11 citations · 3 references
EngineeringMaterials EngineeringMaterials ScienceMaterials ChemistrySemiconductor MaterialsSurface ScienceSemiconductor Device MaterialsSemiconductor SurfacesSilicon MaterialsScanning Electron MicroscopySilicon CarbideSilicon Carbide (Sic) Materials
3
Structural characterization of nanometer SiC films grown on Si
J. P. Li, A. J. Steckl, I. Golecki et al. · Applied Physics Letters · 1993 · 81 citations
Natural Sciences, Materials Engineering, Materials Science +15