Journal of The Electrochemical Society · 1973 · 14 citations · 0 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyDevice CharacterizationDevice ModelingDevice ReliabilityMetal-oxide-semiconductor Field-effect TransistorsSemiconductor ReliabilityBreakdown MechanismsBreakdown VoltageGate Oxide DegradationGate Oxide InterfacesGate OxidesOxide BreakdownOxide Defect States