Japanese Journal of Applied Physics · 1987 · 40 citations · 11 references
EngineeringMaterials SciencePhysicsElectronic MaterialsOptoelectronicsSemiconductor MaterialsEpitaxial GrowthQuantum WellsSemiconductor Crystal GrowthSemiconductor HeterostructuresSemiconductor InterfacesSemiconductor PhysicsMolecular Beam EpitaxyQuantum Well GrowthQuantum Well Growth TechniquesQuantum Well HeterostructuresQuantum Well StructuresX-ray Diffraction Analysis
The intermixing process of InGaAs/InP multiple-quantum-well(MQW) structure by thermal annealing at 500-700°C is investigated. Optical measurement appears to show that the MQW structure is unstable in the annealing above 700°C. SIMS and X-ray analysis, however, reveal that the MQW structure remains basically intact and that this intermixing process is mainly attributable to a minor diffusion of P atoms inducing a lattice-mismatched layer. The pronounced optical peak shifts can be roughly explained on the basis of this minor diffusion process.
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Disorder of an AlAs-GaAs superlattice by impurity diffusion
W. D. Laidig, N. Holonyak, M. D. Camras et al. · Applied Physics Letters · 1981 · 599 citations
Chemical beam epitaxy of InP and GaAs
W. T. Tsang · Applied Physics Letters · 1984 · 255 citations