Microstructural and surface property variations due to the amorphous region formed by thermal annealing in Al-doped ZnO thin films grown on n-Si (100) substrates - Concepedia

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Microstructural and surface property variations due to the amorphous region formed by thermal annealing in Al-doped ZnO thin films grown on n-Si (100) substrates

11

Citations

18

References

2009

Year

Jun Han, Y.S. No, T. W. Kim, Jeong Yong Lee, J.Y. Kim, Won Kook Choi

Applied Surface Science

Materials ScienceSurface Property VariationsAluminium NitrideEngineeringOxide ElectronicsSurface ScienceApplied PhysicsAmorphous RegionThin FilmsAmorphous SolidThin Film Processing

References

	Year	Citations

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