<title>First environmental data from the EUV engineering test stand</title>

Leonard E. Klebanoff, Michael E. Malinowski, Philip A. Grunow, W. Miles Clift, Chip Steinhaus, Alvin H. Leung, Steven J. Haney

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 23 citations · 0 references

Concepts

Abstract

The first environmental data from the Engineering Test Stand (ETS) has been collected. Excellent control of high-mass hydrocarbons has been observed. This control is a result of extensive outgas testing of components and materials, vacuum compatible design of the ETS, careful cleaning of parts and pre-baking of cables and sub assemblies where possible, and clean assembly procedures. As a result of the hydrocarbon control, the residual ETS vacuum environment is rich in water vapor. Analysis of witness plate data indicates that the ETS environment does not pose a contamination risk to the optics in the absence of EUV irradiation. However, with EUV exposure, the water rich environment can lead to EUV- induced water oxidation of the Si-terminated Mo/Si optics. Added ethanol can prevent optic oxidation, allowing carbon growth via EUV cracking of low-level residual hydrocarbons to occur. The EUV environmental issues are understood, mitigation approaches have been validated, and EUV optic contamination appears to be manageable.