IEEE Transactions on Nuclear Science · 2011 · 17 citations · 15 references
EngineeringComputer EngineeringComputer ScienceFault ToleranceFault-tolerant ComputingFault-tolerant SystemsDevice ReliabilityError DetectionFault ModelingHardware Fault ToleranceRadiation HardeningReliable System DesignFault Tolerance MechanismsFault-tolerant Processor DesignRadiation-hardened Integrated CircuitsRadiation-hardened MicroprocessorsRadiation-hardening TechniquesRadiation-induced Error MitigationSingle Event Upset ModelingSystem-level Energy Recovery
We describe the approach used to calculate and verify on-orbit upset rates of radiation hardened microprocessors. System designers use these error rates to choose between microprocessors and add appropriate system-level recovery and redundancy.
15
Characterizing the effects of transient faults on a high-performance processor pipeline
Nachuan Wang, J. Quek, Todd Rafacz et al. · 2004 · 396 citations
An Experimental Study of Soft Errors in Microprocessors
G.P. Saggese, Nachuan Wang, Zbigniew Kalbarczyk et al. · IEEE Micro · 2005 · 160 citations
Chip-level soft error estimation method
Hang Tuan Nguyen, Y. Yagil, N. Seifert et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 112 citations
Engineering, Computer Engineering, Electrical Engineering +17