Statistics
Publications
2
Citations
277
H-Index
2
Active since
2003
Affiliations
Intel (United States)(Current)
Y. Yagil is an author at Intel (United States) specializing in device reliability, computer architecture, and microelectronics.
Publications per year
2003–2005
2
2
A systematic approach to SER estimation and solutions
Hang Tuan Nguyen, Y. Yagil · 2003 · 165 citations
Engineering, Computer Engineering, Electrical Engineering +17
Chip-level soft error estimation method
Hang Tuan Nguyen, Y. Yagil, N. Seifert et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 112 citations
Engineering, Computer Engineering, Electrical Engineering +17
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