Measurement of Fowler-Nordheim tunneling currents in MOS structures under charge trapping conditions

Electron emission in intense electric fields

Ralph Howard Fowler, L. W. Nordheim · Proceedings of the Royal Society of London Series A Containing Papers of a Mathematical and Physical Character · 1928 · 5.7K citations · Full text

Natural Sciences, Materials Science, Physics +9

Fowler-Nordheim Tunneling into Thermally Grown SiO2

M. Lenzlinger, E. H. Snow · Journal of Applied Physics · 1969 · 1.7K citations

Natural Sciences, Materials Science, Physics +14

Electrical Conduction and Dielectric Breakdown in Silicon Dioxide Films on Silicon

C. M. Osburn, E. Weitzman · Journal of The Electrochemical Society · 1972 · 141 citations

Engineering, Electrical Engineering, Materials Science +17

Conduction and trapping of electrons in highly stressed ultrathin films of thermal SiO2

E. Harari · Applied Physics Letters · 1977 · 121 citations

Natural Sciences, Materials Science, Physics +15

High field current induced-positive charge transients in SiO2

Y. Nissan‐Cohen, J. Shappir, D. Frohman‐Bentchkowsky · Journal of Applied Physics · 1983 · 83 citations

Engineering, Materials Engineering, Materials Science +14