Dislocations in strained-layer epitaxy: theory, experiment, and applications

Elements of X-ray Diffraction

E. D. T. Atkins · Physics Bulletin · 1978 · 7.1K citations

Natural Sciences, Materials Science, Physics +9

Superlattice and Negative Differential Conductivity in Semiconductors

L. Esaki, Raphael Tsu · IBM Journal of Research and Development · 1970 · 3.3K citations

Natural Sciences, Materials Science, Physics +12

Defects in epitaxial multilayers I. Misfit dislocations

Jacqueline M. Matthews · Journal of Crystal Growth · 1974 · 3.1K citations

Natural Sciences, Materials Engineering, Materials Science +14

Calculation of critical layer thickness versus lattice mismatch for Ge<i>x</i>Si1−<i>x</i>/Si strained-layer heterostructures

R. People, J. C. Bean · Applied Physics Letters · 1985 · 1.7K citations

Natural Sciences, Materials Engineering, Materials Science +17

Charge collection scanning electron microscopy

H. J. Leamy · Journal of Applied Physics · 1982 · 776 citations

Engineering, Electrical Engineering, Materials Science +17