XPS data for sputter-cleaned In0.53Ga0.47As, GaAs, and InAs surfaces

Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eV

J. H. Scofield · Journal of Electron Spectroscopy and Related Phenomena · 1976 · 5.9K citations

Natural Sciences, Chemistry, Physics +7

Total valence-band densities of states of III-V and II-VI compounds from x-ray photoemission spectroscopy

L. Ley, R. A. Pollak, F. R. McFeely et al. · Physical review. B, Solid state · 1974 · 840 citations

Natural Sciences, Materials Science, Physics +17

Post‐1989 calibration energies for X‐ray photoelectron spectrometers and the 1990 Josephson constant

M. P. Seah · Surface and Interface Analysis · 1989 · 225 citations

Natural Sciences, Electrical Engineering, Nuclear Instrumentation +8

An XPS study of the oxidation of AlAs thin films grown by MBE

J. Ashley Taylor · Journal of Vacuum Science and Technology · 1982 · 190 citations

Natural Sciences, Materials Engineering, Materials Science +17

XPS study of chemically etched GaAs and InP

P. A. Bertrand · Journal of Vacuum Science and Technology · 1981 · 141 citations

Natural Sciences, Materials Engineering, Materials Science +17