Applied Physics Letters · 1990 · 292 citations · 5 references
EngineeringUltrahigh VacuumMicroscopyObserved Atomic CorrugationsElectron MicroscopyMicroscopy MethodBiophysicsMaterials SciencePhysicsAtomic PhysicsSynchrotron RadiationShort-range Repulsive RegimeSpectroscopySurface ScienceApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopyElectron MicroscopeMedicine
We have imaged, in ultrahigh vacuum, the (001) surface of NaCl using an optical-beam-deflectin force microscope operating in the short-range repulsive regime. The design and performance characteristics of the microscope are given, and the observed atomic corrugations are compared with those deduced from He-atom scattering experiments.
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