Concepedia

GaAs wafer mapping by microwave-detected photoconductivity

J. R. Niklas, W. Siegel, M. Jurisch, U. Kretzer

Materials Science and Engineering B · 2001 · 19 citations · 2 references

Concepts

EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsMicrowave Integrated CircuitsMicrowave MeasurementsMicrowave Semiconductor DevicesSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsGaas Microwave Integrated CircuitsMicrowave DevicesPhotoconductive GainPhotoconductivitySemiconductor Materials For Microwave Devices

References

2

Origin of microscopic inhomogeneities in bulk gallium arsenide

E. Molva, Ph. Bunod, Amal Chabli et al. · Journal of Crystal Growth · 1990 · 19 citations

Natural Sciences, Materials Science, Physics +6

Point-contact measurements for high-resolution profiling of high-resistivity III - V semiconductors

W. Siegel, G. Kühnel, J. R. Niklas et al. · Semiconductor Science and Technology · 1996 · 16 citations

Engineering, Electrical Engineering, Materials Science +17