J. R. Niklas - Concepedia

Author

J. R. Niklas

Paderborn University

Also Known As

Dornich, K., J R Niklas, J. Niklas, J. R. Niklas, J.-R. Niklas, J.R Niklas, J.R. Niklas, Jürgen R. Niklas, Schüler, N.

Publications

1.3K

Citations

H-Index

Concepts

All Affiliations

Paderborn University TU Bergakademie Freiberg Freiberger Compound Materials (Germany)Ruhr University Bochum

About

J. R. Niklas is an author at Paderborn University specializing in engineering, physics, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	16	27	614
2	Applied Physics	14	22	502
3	Natural Sciences	13	15	357
4	Chemistry	10	10	239
5	Education	1	1	12

J. R. Niklas

Publications

703

Citations

H-Index

Page 1

	Year	Citations
Structure of thermal donors (NL8) in silicon: A study with electron-nuclear double resonance Jürgen Michel, J. R. Niklas, J.‐M. Spaeth Physical review. B, Condensed matter EngineeringNuclear PhysicsThermal DonorsChemistrySilicon On Insulator	1989	64
Application of ENDOR‐Induced Electron Spin Resonance to the Study of Point Defects in Solids J. R. Niklas, J.‐M. Spaeth physica status solidi (b) Point DefectsNuclear PhysicsEngineeringMagnetic ResonanceDefect Tolerance	1980	47
Endor investigation of tellurium donors in silicon J. R. Niklas, J.‐M. Spaeth Solid State Communications Tellurium DonorsEngineeringApplied PhysicsSemiconductor Device FabricationElectronic Packaging	1983	44
Electron nuclear double resonance of interstitial iron in silicon S. Greulich‐Weber, J. R. Niklas, E. R. Weber, Physical review. B, Condensed matter EngineeringMagnetic ResonanceSilicon On InsulatorDefect ToleranceMagnetism	1984	43
Stochastic ENDOR W. Bruggemann, J. R. Niklas Journal of Magnetic Resonance Series A	1994	37
Sensitivity enhancement in ESR/ENDOR spectrometers by use of microwave amplifiers Ch. Hoentzsch, J. R. Niklas, J.‐M. Spaeth Review of Scientific Instruments Microwave SpectroscopyElectronic InstrumentationEngineeringAnalytical InstrumentationNormal Homodyne Spectrometer	1978	31
Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD‐PICTS) and microwave detected photoconductivity (MDP) Bastian Berger, Nadine Schüler, Sabrina Anger, physica status solidi (a) EngineeringDefect ParametersSemiconductor DeviceSemiconductorsPhotoelectric Sensor	2011	28
High resolution rare-earth elements analyses of natural apatite and its application in geo-sciences: Combined micro-PIXE, quantitative CL spectroscopy and electron spin resonance analyses Dirk Habermann, T. Götte, Jan Meijer, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms Materials ScienceRare Earth MineralEngineeringTrace Element GeochemistryNatural Apatite	2000	25
Thermal Donors in Silicon: A Study with ENDOR Jürgen Michel, J. R. Niklas, J.‐M. Spaeth, Physical Review Letters EngineeringThermal DonorsChemistrySilicon On InsulatorSpectroscopic Property	1986	25
ENDOR Study of Cubic Fe<sup>3+</sup> Centres in KMgF<sub>3</sub> R. C. DuVarney, J. R. Niklas, J.‐M. Spaeth physica status solidi (b) Shf InteractionEngineeringPhysicsNatural SciencesCondensed Matter Physics	1981	24

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