Journal of Applied Physics · 1969 · 26 citations · 9 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDiffusion In SolidsDopingLight-emitting DiodesSemiconductor Device MaterialsSemiconductor PhysicsCurrent DensityDiffusion In SemiconductorsLight-emitting Diode MaterialsSemiconductor Light-emitting MaterialsSilicon CarbideSilicon Carbide (Sic) MaterialsTemperature Dependence Of Diodes
Electroluminescent diodes were prepared by the simultaneous diffusion of boron and aluminum at 2150° to 2250°C into nitrogen-doped, n-type 6H SiC crystals. These diodes exhibit a typical brightness of 50 ft·L (170 nit) at a current density of 5 A/cm2 for temperatures of 25° to above 200°C. The results of various measurements on these diodes are presented and the anomalous nature of the diffusion is discussed.
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Ion Drift in an <i>n-p</i> Junction
E. M. Pell · Journal of Applied Physics · 1960 · 265 citations
H. E. Farnsworth · Journal of the American Chemical Society · 1959 · 120 citations
Electrical Contacts to Silicon Carbide
R. N. Hall · Journal of Applied Physics · 1958 · 78 citations