Applied Physics Letters · 1997 · 175 citations · 8 references
EngineeringElectrical EngineeringSemiconductor DevicesSemiconductor MaterialsTransport PhenomenaCarrier TransportCharge Carrier TransportElectron TransportMonte Carlo Transport MethodsSemiconductor PhysicsTransport PropertiesCarrier Transport In SemiconductorsCarrier Transport MechanismsCarrier Velocity OvershootElectron Transport In SemiconductorsElectron Transport SimulationMonte Carlo Electron TransportOvershootTransport In Semiconductors
An ensemble Monte Carlo simulation is used to compare high field electron transport in bulk GaN and GaAs. In particular, velocity overshoot and electron transit times are examined. In GaN, we find the steady state velocity of the electrons is the most important factor determining transit time over distances longer than 0.2 μm. Over shorter distances velocity overshoot effects in GaN at high fields are comparable to those in GaAs. We estimate the minimum transit time across a 1 μm GaN sample to be about 3.0 ps. Similar calculations for GaAs yield 5.4 ps.
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Emerging gallium nitride based devices
S. Noor Mohammad, A. Salvador, H. Morkoç̌ · Proceedings of the IEEE · 1995 · 614 citations
J. Kolník, İsmail H. Oğuzman, Kevin F. Brennan et al. · Journal of Applied Physics · 1995 · 328 citations