Japanese Journal of Applied Physics · 1986 · 13 citations · 10 references
Materials ScienceEngineeringOptical PropertiesNanotechnologyRaman Image MeasurementsApplied PhysicsLaser ApplicationsOptical SpectroscopyScanning Raman MicroprobeCrystallographic OrientationsSurface-enhanced Raman ScatteringPulsed Laser DepositionNanometrologyRaman MicroprobeLaser-assisted DepositionOptical CharacterizationSilicon On Insulator
We have measured two-dimensional Raman intensity images of laser-recrystallized polycrystalline silicon islands on insulators by a scanning Raman microprobe. It is found that crystallites with about ten µm size grow along the scanning direction of an annealing laser. The crystallographic orientations of the crystallites have been determined by Raman microprobe polarization measurements.
10
Silicon graphoepitaxy using a strip-heater oven
M. W. Geis, D.A. Antoniadis, D. J. Silversmith et al. · Applied Physics Letters · 1980 · 79 citations
Materials Science, Electrical Engineering, Silicon Graphoepitaxy +9
Enhanced Raman scattering from silicon microstructures
Daniel V. Murphy, S. R. J. Brueck · Optics Letters · 1983 · 59 citations
Plasmonics, Engineering, Physics +14