Journal of Applied Physics · 1993 · 114 citations · 6 references
EngineeringMaterials EngineeringMaterials ScienceSemiconductor MaterialsSurface ScienceThin FilmsSemiconductor Device MaterialsSemiconductor ReliabilitySemiconductor SurfacesThermal Properties Of MaterialsThermal Properties Of SemiconductorsThin Film Thermal PropertiesHigh-temperature Thermal PropertiesNitride Thin FilmsNitrides Thin FilmsThermal StabilityThermal Stability Of MaterialsThin Film Stability
We examine the thermal stability of InN single crystal films. The films are not entirely stable and degrade at relatively low temperatures. No change on the surface of the film is found after heating the samples up to 500 °C in nitrogen atmosphere. However, if the films are heated above 550 °C, the surface undergoes a considerable change, owing to the decomposition and desorption of nitrogen.
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