MOS hydrogen sensor with very fast response based on ultra-thin thermal SiO2 film

The hydrogen economy in the 21st century: a sustainable development scenario

Leonardo Barreto, Atsutoshi Makihira, Keywan Riahi · International Journal of Hydrogen Energy · 2002 · 964 citations · Full text

Engineering, Chemical Engineering, Environmental Engineering +16

CMOS scaling into the nanometer regime

Yuan Taur, D. A. Buchanan, Wei Chen et al. · Proceedings of the IEEE · 1997 · 889 citations

Engineering, Computer Engineering, Electrical Engineering +17

Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFET's

S.-H. Lo, D. A. Buchanan, W. Wang · IEEE Electron Device Letters · 1997 · 812 citations

Engineering, Electrical Engineering, Microelectronics +16

Trap creation in silicon dioxide produced by hot electrons

D. J. DiMaria, J. Stasiak · Journal of Applied Physics · 1989 · 615 citations

Natural Sciences, Materials Science, Physics +17

MOS capacitance measurements for high-leakage thin dielectrics

Kevin Yang, Chenming Hu · IEEE Transactions on Electron Devices · 1999 · 491 citations

Engineering, Electrical Engineering, Materials Science +17