Publication | Closed Access
Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors
682
Citations
45
References
2006
Year
SemiconductorsMaterials ScienceAluminium NitrideEngineeringApplied PhysicsN Alloy SemiconductorsSemiconductor MaterialDefect FormationDefect ToleranceMicrostructure
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