Electronics Letters · 1999 · 12 citations · 1 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesBuilt-in Self-testCurrent-voltage CharacteristicsDesign For TestabilityDevice CharacterizationElectrical CharacterizationElectrical System TestingCircuit Transient AnalysisCurrent Signature AnalysisCurrent-voltage CharacterizationPower ConsumptionPower Consumption ModelingPower Electronics Fault Diagnosis
A test technique that uses the charge driven into the circuit computed from the transient power supply current is analysed. Experimental data are provided concerning the merits of this technique and its effectiveness at detecting open defects that do not increase the power consumption (those that cannot be detected with IDDQ).
1
Built-in dynamic current sensor circuitfor digital VLSI CMOS testing
J. Segura, M. Roca, D. Mateo et al. · Electronics Letters · 1994 · 18 citations
Engineering, Computer Engineering, Electrical Engineering +10