Applied Physics Letters · 1994 · 74 citations · 14 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsSemiconductor MaterialsSurface ScienceEpitaxial GrowthOptical Properties Of SemiconductorsSemiconductor Crystal GrowthSemiconductor HeterostructuresSemiconductor PhysicsSemiconductor SurfacesEpitaxial Growth MorphologyHeteroepitaxyHeterostructure MaterialsHeterostructuresLayer Thickness EffectsMetalorganic Vapor Phase EpitaxyMolecular Beam EpitaxyTemperature-dependent Growth
The controlled step bunching on GaAs (311)A oriented surfaces during growth by metalorganic vapor-phase epitaxy (MOVPE) leads to one-dimensional faceting with a lateral period tunable upon growth temperature and layer thickness in the mesoscopic size range 25–80 nm. The surface morphology established during MOVPE growth directly images the microscopic surface structure maintained during growth by conventional solid source molecular beam epitaxy (MBE) and allows us to control the lateral period in GaAs/AlGaAs wire-like heterostructures. The red shift of the luminescence at room temperature from these structures is directly correlated with the lateral period of faceting.
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Direct synthesis of corrugated superlattices on non-(100)-oriented surfaces
R. Nötzel, N. N. Ledentsov, L. Däweritz et al. · Physical Review Letters · 1991 · 296 citations
Mani Sundaram, Scott Chalmers, P. F. Hopkins et al. · Science · 1991 · 180 citations
M. Hata, Toshiro Isu, A. Watanabe et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1990 · 160 citations
Natural Sciences, Materials Engineering, Materials Science +17