High Quality Ohmic Contacts on n-type 3C-SiC Obtained by High and Low Process Temperature

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation A. E. Bazin, J. F. Michaud, F. Cayrel, M. Portail, T. Chassagne, M. Zielinski, E. Collard, D. Alquier; High Quality Ohmic Contacts on n‐type 3C‐SiC Obtained by High and Low Process Temperature. AIP Conf. Proc. 1 November 2010; 1292 (1): 51–54. https://doi.org/10.1063/1.3518309 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search